Reference "Epistasis for three grain yield components in rice (Oryza sativa L.)"

Reference ID

5355

Title

Epistasis for three grain yield components in rice (Oryza sativa L.)

Source

Genetics, 1997, vol. 145, pp. 453-465

Authors (5)

Li-Z-K	Pinson-S-R
Park-W-D	Paterson-A-H
Stansel-J-W

Abstract

The genetic basis for three grain yield components of rice, 1000 kernel weight
(KW), grain number per panicle (GN), and grain weight per panicle (GWP), was
investigated using restriction fragment length polymorphism markers and F4
progency testing from a cross between rice subspecies japonica (cultivar
Lemont from USA) and indica (cv. Tequing from China). Following identification
of 19 QTL affecting these traits, we investigated the role of epistasis in
genetic control of these phenotypes. Among 63 markers distributed throughout
the genome that appeared to be involved in 79 highly significant (P < 0.001)
interactions, most (46 or 73%) did not appear to have "main" effects on the
relevant traits, but influenced the trait(s) predominantly through
interactions. These results indicate that epistasis is an important genetic
basis for complex traits such as yield components, especially traits of low
heritability such as GN and GWP. The identification of epistatic loci is an
important step toward resolution of discrepancies between quantitative trait
loci mapping and classical genetic dogma, contributes to better understanding
of the persistence of quantitative genetic variation in populations, and
impels reconsideration of optimal mapping methodology and marker-assisted
breeding strategies for improvement of complex traits.